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4M x 32-Bit Dynamic RAM Module HYM 324020S/GS-60/-70 Preliminary Information * 4 194 304 words by 32-bit organization (alternative 8 388 608 words by 16-bit) Fast access and cycle time 60 ns access time 110 ns cycle time (-60 version) 70 ns access time 130 ns cycle time (-70 version) Fast page mode capability 40 ns cycle time (-60 version) 45 ns cycle time (-70 version) Single + 5 V ( 10 %) supply Low power dissipation max. 4840 mW active (HYM 324020S/GS-60) max. 4400 mW active (HYM 324020S/GS-70) CMOS - 44 mW standby TTL - 88 mW standby * * CAS-before-RAS refresh RAS-only-refresh Hidden-refresh 8 decoupling capacitors mounted on substrate All inputs, outputs and clocks fully TTL compatible 72 pin Single in-Line Memory Module with 22.86 mm (900 mil) height Utilizes eight 4Mx4-DRAMs in 300mil wide SOJ-packages 2048 refresh cycles / 32 ms Tin-Lead contact pads (S - version) Gold contact pads (GS - version) * * * * * * * * * * Ordering Information Type HYM 324020S-60 HYM 324020S-70 HYM 324020GS-60 HYM 324020GS-70 Ordering Code Q67100-Q979 Q67100-Q980 Q67100-Q2005 on request Package L-SIM-72-12 L-SIM-72-12 L-SIM-72-12 L-SIM-72-12 Description DRAM Module (access time 60 ns) DRAM Module (access time 70 ns) DRAM Module (access time 60 ns) DRAM Module (access time 70 ns) Semiconductor Group 571 09.94 HYM 324020S/GS-60/-70 4M x 32-Bit The HYM 324020S/GS-60/-70 is a 16 M Byte DRAM module organized as 4 194 304 words by 32-bit in a 72-pin single-in-line package comprising eight HYB 5117400BJ 4M x 4 DRAMs in 300 mil wide SOJ-packages mounted together with eight 0.2 F ceramic decoupling capacitors on a PC board. The HYM 324020S/GS-60/-70 can also be used as a 8 388 608 words by 16-bits dynamic RAM module by means of connecting DQ0 and DQ16, DQ1 and DQ17, DQ2 and DQ18, ..., DQ15 and DQ31, respectively. Each HYB 5117400BJ is described in the data sheet and is fully electrical tested and processed according to SIEMENS standard quality procedure prior to module assembly. After assembly onto the board, a further set of electrical tests is performed. The speed of the module can be detected by the use of four presence detect pins. The common I/O feature on the HYM 324020S/GS-60/-70 dictates the use of early write cycles. Pin Definitions and Functions Pin No. A0-A10 DQ0-DQ31 CAS0 - CAS3 RAS0, RAS2 WE Functions Address Inputs for HYM 324020S/GS Data Input/Output Column Address Strobe Row Address Strobe Read/Write Input Power (+ 5 V) Ground Presence Detect Pin No Connection VCC VSS PD N.C. Presence Detect Pins -60 PD0 PD1 PD2 PD3 -70 VSS N.C. N.C. N.C. VSS N.C. VSS N.C. Semiconductor Group 572 HYM 324020S/GS-60/-70 4M x 32-Bit Pin Configuration (top view) Semiconductor Group 573 HYM 324020S/GS-60/-70 4M x 32-Bit Block Diagram Semiconductor Group 574 HYM 324020S/GS-60/-70 4M x 32-Bit Absolute Maximum Ratings Operation temperature range ......................................................................................... 0 to + 70 C Storage temperature range......................................................................................... - 55 to 125 C Soldering temperature ............................................................................................................ 260 C Soldering time ............................................................................................................................. 10 s Input/output voltage ........................................................................ - 0.5 V to min (VCC + 0.5, 7.0) V Power supply voltage...................................................................................................... - 1 to + 7 V Power dissipation................................................................................................................... 6.16 W Data out current (short circuit) ................................................................................................ 50 mA Note:Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage of the device. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. DC Characteristics1) TA = 0 to 70 C, VCC = 5 V 10 % Parameter Input high voltage Input low voltage Output high voltage (IOUT = - 5 mA) Output low voltage (IOUT = 4.2 mA) Input leakage current (0 V < VIN < 6.5 V, all other pins = 0 V) Output leakage current (DO is disabled, 0 V < VOUT < 5.5 V) Symbol Limit Values min. max. 2.4 - 0.5 2.4 - - 20 - 10 Unit Test Condition VIH VIL VOH VOL II(L) IO(L) VCC + 0.5 V 0.8 - 0.4 20 10 V V V A A ICC1 Average VCC supply current (RAS, CAS, address cycling, tRC = tRC min) 60 ns - Version 70 ns - Version Standby VCC supply current (RAS = CAS = VIH) Average VCC supply current during RAS only refresh cycles (RAS cycling, CAS = VIH, tRC = tRC min) 60 ns - Version 70 ns - Version - - - 880 800 16 mA mA mA 2) 3) ICC2 ICC3 - - 880 800 mA mA 2) Semiconductor Group 575 HYM 324020S/GS-60/-70 4M x 32-Bit DC Characteristics1) (cont'd) Parameter Average VCC supply current during fast page mode (RAS = VIL, CAS, address cycling, tPC = tPC min) 60 ns - Version 70 ns - Version Standby VCC supply current (RAS = CAS = VCC - 0.2 V) Average VCC supply current during CAS-before-RAS refresh mode (RAS, CAS cycling, tRC = tRC min) 60 ns - Version 70 ns - Version Symbol Limit Values min. max. Unit Test Condition ICC4 - - 640 560 8 mA mA mA 2) 3) ICC5 ICC6 - 2) - - 880 800 mA mA Capacitance TA = 0 to 70 C, VCC = 5 V 10 %, f = 1 MHz Parameter Input capacitance (A0 to A10,WE) Input capacitance (RAS0, RAS2) Input capacitance (CAS0 - CAS3) I/O capacitance (DQ0-DQ31) Symbol Limit Values min. max. 90 45 40 25 pF pF pF pF - - - - Unit CI1 CI2 CI3 CIO Semiconductor Group 576 HYM 324020S/GS-60/-70 4M x 32-Bit AC Characteristics 4) 5) TA = 0 to 70 C, VCC = 5 V 10 %, tT = 5 ns Parameter Symbol Limit Values HYM 324020S/GS-60 min. Random read or write cycle time Fast page mode cycle time Access time from RAS Access time from CAS Access time from column address Access time from CAS precharge CAS to output in low-Z Output buffer turn-off delay Transition time (rise and fall) RAS precharge time RAS pulse width RAS pulse width (fast page mode) CAS precharge to RAS delay RAS hold time CAS hold time CAS pulse width RAS to CAS delay time RAS to column address delay time CAS to RAS precharge time CAS precharge time (fast page mode) Row address setup time Row address hold time Column address setup time Column address hold time 11) 6) 11) 12) 6) 11) Unit HYM 324020S/GS-70 min. 130 45 - - - - 0 0 3 50 70 70 40 20 70 20 20 15 5 10 0 10 0 15 max. - - 70 20 35 40 - 20 50 - 10000 200000 - - - 10000 50 35 - - - - - - ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns max. - - 60 15 30 35 - 20 50 - 10000 200000 - - - 10000 45 30 - - - - - - tRC tPC tRAC tCAC tAA 110 40 - - - - 0 0 3 40 60 60 35 15 60 15 20 15 5 10 0 10 0 15 6) 12) tCPA 6) 6) 7) 5) tCLZ tOFF tT tRP tRAS tRASP tRHCP tRSH tCSH tCAS tRCD tRAD 12) tCRP tCP tASR tRAH tASC tCAH Semiconductor Group 577 HYM 324020S/GS-60/-70 4M x 32-Bit AC Characteristics4) 5) (cont'd) TA = 0 to 70 C, VCC = 5 V 10 %, tT = 5 ns Parameter Symbol Limit Values HYM 324020S/GS-60 min. Column address to RAS lead time tRAL Read command setup time Read command hold time Read command hold time ref. to RAS Write command hold time Write command pulse width Write command to RAS lead time Write command to CAS lead time Data setup time Data hold time Refresh period Write command setup time CAS setup time CAS hold time RAS to CAS precharge time CAS precharge time Write to RAS precharge time Write hold time ref. to RAS 13) 13) 10) 13) 13) 9) 9) 8) Unit HYM 324020S/GS-70 min. 35 0 0 0 15 15 20 20 0 15 - 0 10 10 5 10 10 10 max. - - - - - - - - - - 32 - - - - - - - ns ns ns ns ns ns ns ns ns ns ms ns ns ns ns ns ns ns max. - - - - - - - - - - 32 - - - - - - - 30 0 0 0 10 10 15 15 0 15 - 0 10 10 5 10 10 10 tRCS tRCH tRRH 8) tWCH tWP tRWL tCWL tDS tDH tREF tWCS tCSR tCHR tRPC tCP tWRP tWRH Semiconductor Group 578 HYM 324020S/GS-60/-70 4M x 32-Bit Notes 1) All voltages are referenced to VSS. 2) ICC1, ICC3, ICC4 and ICC6 depend on cycle rate. 3) ICC1 and ICC4 depend on output loading. Specified values are measured with the output open. 4) An initial pause of 200 s is required after power-up followed by 8 RAS cycles out of which at least one cycle has to be a refresh cycle before proper device operation is achieved. In case of using internal refresh counter, a minimum of 8 CAS-before-RAS initialization cycles instead of 8 RAS cycles are required. 5) VIH (max) and VIL (max) are reference levels for measuring timing of input signals. Transition times are also measured between VIH and VIL. 6) Measured with a load equivalent of 2 TTL loads and 100 pF. 7) tOFF (max) defines the time at which the output achieves the open-circuit condition and is not referenced to output voltage levels. 8) Either tRCH or tRRH must be satisfied for a read cycle. 9) These parameters are referenced to the CAS leading edge. 10) tWCS is not a restrictive operating parameter. This is included in the data sheet as electrical characteristic only. If tWCS > tWCS (min), the cycle is an early write cycle and data out pin will remain open (high impedance). 11) Operation within the tRCD (max) limit insures that tRAC (max) can be met. tRCD (max) is specified as a reference point only. If tRCD is greater than the specified tRCD (max) limit, then access time is controlled by tCAS. 12) Operation within the tRAD (max) limit insures that tRAC (max) can be met. tRAD (max) is specified as a reference point only. If tRAD is greater than the specified tRAD (max) limit, then access time is controlled by tAA. 13) For CAS-before-RAS cycles only. Semiconductor Group 579 |
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